Details
Title
Wedge cleaving for TEM samples preparation and interface analysis
Author(s)
Ruterana, P ; Laub, D
Published in
ICEM
Pages
1019-1020
Date
1994
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2007-02-15