Microstructural characterization of Ni/Ti multilayers with TEM, EDS and PEELS
1994
Details
Title
Microstructural characterization of Ni/Ti multilayers with TEM, EDS and PEELS
Author(s)
Leifer, K ; Buffat, PA ; Böni, P ; Elsenhans, O ; Friedli, HP ; Grimmer, H ; Anderson, IS
Published in
ICEM
Pages
189-190
Date
1994
Other identifier(s)
View record in Web of Science
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2007-02-15