HREM strain measurement of ultra thin ZnTe and MnTe layers grown in CdTe


Published in:
Proceedings of the Royal Microscopical Society Conference., 134, 329-332
Presented at:
Bristol, UK
Year:
1993
Publisher:
Microscopy of Semiconducting Materials
Laboratories:




 Record created 2007-02-15, last modified 2018-03-17


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