Characterization of semi-conductor materials by WTEM and SIMS
1993
Details
Title
Characterization of semi-conductor materials by WTEM and SIMS
Author(s)
Ganière, JD ; Buffat, PA ; Nguyen-Hong, KY ; Blanchard, B ; Spycher, R
Published in
Analusis
Volume
21
Pages
M12-M14
Date
1993
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2007-02-15