Characterization of short-period Si/sub m/Ge/sub n/ superlattices by high-resolution transmission electron microscopy and X-ray diffraction
1992
Details
Title
Characterization of short-period Si/sub m/Ge/sub n/ superlattices by high-resolution transmission electron microscopy and X-ray diffraction
Author(s)
Jager, W ; Stenkamp, D ; Ehrhart, P ; Leifer, K ; Sybertz, W ; Kibbel, H ; Presting, H ; Kasper, E
Published in
thin solid films
Volume
222
Issue
1-2
Pages
221-6
Date
1992
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2007-02-15