Structural characterization of short-period Si/sub m/Ge/sub n/ superlattices by transmission electron microscopy and X-ray diffraction
1991
Details
Title
Structural characterization of short-period Si/sub m/Ge/sub n/ superlattices by transmission electron microscopy and X-ray diffraction
Author(s)
Jager, W ; Leifer, K ; Ehrhart, P ; Kasper, E ; Kibbel, H
Published in
Silicon Molecular Beam Epitaxy Symposium.
Volume
220
Pages
167-73
Date
1991
Publisher
Mater. Res. Soc
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2007-02-15