Wedge TEM characterization of movpe GaInAs/InP layers, concentration grading at interfaces
1990
Details
Title
Wedge TEM characterization of movpe GaInAs/InP layers, concentration grading at interfaces
Author(s)
Spycher, R ; Stadelmann, PA ; Buffat, PA
Published in
Mat. Res. Soc. Symp. Proc.
Volume
198
Pages
135-140
Date
1990
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2007-02-15