Details
Title
Atomic scale study of local TiSi2/Si epitaxies
Author(s)
Catana, A ; Schmid, PE ; Heintze, M ; Lévy, F
Published in
Journal of Applied Physics
Volume
67
Issue
4
Pages
1820-1825
Date
1990
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2007-02-15