Transmission and reflection electron microscopy on cleaved edges of III-V multilayers structures
1990
Details
Title
Transmission and reflection electron microscopy on cleaved edges of III-V multilayers structures
Author(s)
Buffat, PA ; Ganière, JP ; Stadelmann, PA
Published in
Electron Microscopy
Pages
319-333
Date
1990
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2007-02-15