Simulation of high resolution electron microscope images and 2-dimensional convergent beam electron diffraction patterns
1989
Details
Title
Simulation of high resolution electron microscope images and 2-dimensional convergent beam electron diffraction patterns
Author(s)
Stadelmann, PA ; Buffat, PA
Published in
JOM Journal of the minerals, metals and materials society
Volume
41
Pages
159-169
Date
1989
Note
chercher réf. exacte !
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2007-02-15