The structure of thin mettalic layers for ohmic and Schottky contacts in GaAs and silicon devices


Published in:
Microscopy of Semiconducting Materials. Proceedings of the Royal Microscopical Society Conference, 677-682
Presented at:
Royal Microscopical Society Conference
Year:
1989
Laboratories:




 Record created 2007-02-15, last modified 2018-01-27


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