Characterization by transmission electron microscopy of wedge shaped semiconductor samples
1989
Details
Title
Characterization by transmission electron microscopy of wedge shaped semiconductor samples
Author(s)
Ganière, JD ; Reinhart, FK ; Spycher, R ; Catana, A ; Ruterana, P ; Stadelmann, PA ; Buffat, PA
Published in
Journal de microscopie et de spectroscopie électroniques
Volume
14
Pages
407-414
Date
1989
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2007-02-15