Characterization of GaAs/(GaAs)n(AlAs)m surface-emitting laser structures through reflectivity and high-resolution electron microscopy measurements
1989
Details
Title
Characterization of GaAs/(GaAs)n(AlAs)m surface-emitting laser structures through reflectivity and high-resolution electron microscopy measurements
Author(s)
Faist, J ; Ganière, JD ; Buffat, PA ; Sampson, S ; Reinhart, FK
Published in
Journal of Applied Physics
Volume
66
Issue
3
Pages
1023-1032
Date
1989
Other identifier(s)
View record in Web of Science
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2007-02-15