Atomic structure at the CoSi2/Si<111>interface
1989
Details
Title
Atomic structure at the CoSi2/Si<111>interface
Author(s)
Catana, A ; Rieubland, S ; Schmid, PE ; Stadelmann, PA
Published in
Microscopy of Semiconducting Materials. Proceedings of the Royal Microscopical Society Conference
Volume
100
Issue
8
Pages
621-626
Date
1989
Publisher
IOP Publishing Ldt
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2007-02-15