000100410 001__ 100410
000100410 005__ 20181203020722.0
000100410 0247_ $$2doi$$a10.1002/jemt.1060100403
000100410 02470 $$2ISI$$aA1988R722700002
000100410 037__ $$aARTICLE
000100410 245__ $$aHigh-resolution electron microscopy image simulation on a Cray 1S/2300 computer
000100410 269__ $$a1988
000100410 260__ $$c1988
000100410 336__ $$aJournal Articles
000100410 700__ $$aSpycher, R
000100410 700__ $$0240052$$aStadelmann, PA$$g106465
000100410 700__ $$0240619$$aBuffat, PA$$g104664
000100410 700__ $$aFlüeli, M
000100410 773__ $$j10$$k4$$q369-372$$tJournal of Electron Microscopy Technique
000100410 909C0 $$0252025$$pCIME$$xU10192
000100410 909CO $$ooai:infoscience.tind.io:100410$$pSB$$particle
000100410 937__ $$aCIME-ARTICLE-1988-013
000100410 970__ $$a194/CIME
000100410 973__ $$aEPFL$$rREVIEWED$$sPUBLISHED
000100410 980__ $$aARTICLE