Structure imaging of perfect V/sub 3/Si (A15 structure) by high resolution electron microscopy
1984
Details
Title
Structure imaging of perfect V/sub 3/Si (A15 structure) by high resolution electron microscopy
Author(s)
Ben-Lamine, A ; Lahana, MJ ; Reynaud, F ; Stadelmann, PA
Published in
J Mater Sci Lett
Volume
3
Issue
5
Pages
431-7
Date
1984
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2007-02-15