000100347 001__ 100347
000100347 005__ 20180317092827.0
000100347 037__ $$aCONF
000100347 245__ $$aExpériences de déformation à basse température dans un microscope électronique de 200 kV
000100347 269__ $$a1979
000100347 260__ $$bJ. Microsc. Spectrosc. Electron.$$c1979
000100347 336__ $$aConference Papers
000100347 700__ $$aGotthardt, R
000100347 700__ $$0240619$$aBuffat, PA$$g104664
000100347 773__ $$j4$$q24a$$tColl. Soc. Franç. Microsc. Electron.
000100347 909CO $$ooai:infoscience.tind.io:100347$$pSB$$pconf
000100347 909C0 $$0252025$$pCIME$$xU10192
000100347 937__ $$aCIME-CONF-1979-001
000100347 970__ $$a502/CIME
000100347 973__ $$aEPFL$$rREVIEWED$$sPUBLISHED
000100347 980__ $$aCONF