Low temperature "In Situ" deformation in a 200 kV scanning transmission Electron Microscope
1979
Details
Title
Low temperature "In Situ" deformation in a 200 kV scanning transmission Electron Microscope
Author(s)
Gotthardt, R ; Guisolan, B ; Buffat, PA
Published in
Journal de microscopie et de spectroscopie électroniques
Volume
4
Issue
5
Pages
587-594
Date
1979
Other identifier(s)
View record in Web of Science
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2007-02-15