conference paper
Very high resolution digital elevation models (VHR DEMs) and multiscale landscale genomics analysis applied to an alpine plant species
2011
SIGSPATIAL
Cite this item
Leempoel, K., Stucki, S., Parisod, C., & Joost, S. (2011). Very high resolution digital elevation models (VHR DEMs) and multiscale landscale genomics analysis applied to an alpine plant species. Sigspatial, Special(3), 10–14. https://doi.org/10.1145/2078296.2078299
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Type
conference paper
Author(s)
Date Issued
2011
Published in
SIGSPATIAL
Volume
Special
Issue
3
Start page
10
End page
14
Editorial or Peer reviewed
NON-REVIEWED
Written at
EPFL
EPFL units
| Event name | Event place | Event date |
Chicago, USA | October 28-November 6, 2011 | |
Available on Infoscience
January 24, 2012
Use this identifier to reference this record