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  4. Super-resolved position and orientation of fluorescent dipoles
 
conference paper

Super-resolved position and orientation of fluorescent dipoles

Aguet, François
•
Geissbühler, Stefan  
•
Märki, Iwan  
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2009
Proceedings of SPIE
ECBO 2009, Advanced Microscopy Techniques

We introduce an efficient, image formation model-based algorithm that extends super-resolution fluorescence localization to include orientation estimation, and report experimental accuracies of 5 nanometers for position estimation and 2 degrees for dipole orientation estimation.

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Type
conference paper
DOI
10.1117/12.831488
Author(s)
Aguet, François
Geissbühler, Stefan  
Märki, Iwan  
Lasser, Theo  
Unser, Michael
Date Issued

2009

Publisher

SPIE

Published in
Proceedings of SPIE
Volume

7367

Start page

73670Y

Editorial or Peer reviewed

NON-REVIEWED

Written at

EPFL

EPFL units
LOB  
Event nameEvent placeEvent date
ECBO 2009, Advanced Microscopy Techniques

Munich, Germany

June 14-18 2009

Available on Infoscience
October 27, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/43905
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