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  4. Comparison of Wide-Band-Gap Technologies for Soft-Switching Losses at High Frequencies (vol 35, pg 12595, 2020)
 
research article

Comparison of Wide-Band-Gap Technologies for Soft-Switching Losses at High Frequencies (vol 35, pg 12595, 2020)

Jafari, Armin  
•
Samizadeh Nikoo, Mohammad  
•
Perera, Nirmana  
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February 1, 2021
IEEE Transactions on Power Electronics
  • Details
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Type
research article
DOI
10.1109/TPEL.2020.3017073
Web of Science ID

WOS:000574748200107

Author(s)
Jafari, Armin  
Samizadeh Nikoo, Mohammad  
Perera, Nirmana  
Yildirim, Halil Kerim  
Karakaya, Furkan
Soleimanzadeh, Reza  
Matioli, Elison  
Date Issued

2021-02-01

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Published in
IEEE Transactions on Power Electronics
Volume

36

Issue

2

Start page

2444

End page

2445

Subjects

Engineering, Electrical & Electronic

•

Engineering

•

logic gates

•

loss measurement

•

transistors

•

current measurement

•

frequency measurement

•

voltage measurement

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

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POWERLAB  
AQUA  
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March 26, 2021
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/176253
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