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  4. Realizing quantum image scanning microscopy with novel detectors
 
conference presentation

Realizing quantum image scanning microscopy with novel detectors

Lubin, Gur
•
Tenne, Ron
•
Antolovic, Ivan Michel  
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February 1, 2020
Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II
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Type
conference presentation
Author(s)
Lubin, Gur
Tenne, Ron
Antolovic, Ivan Michel  
Charbon, Edoardo  
Bruschini, Claudio  
Oron, Dan
Date Issued

2020-02-01

URL
https://spie.org/PWO/conferencedetails/opto-atomic-entanglement-enhanced-metrology
Written at

EPFL

EPFL units
AQUA  
Event nameEvent placeEvent date
Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II

San Francisco, CA, USA

February 1-6, 2020

Available on Infoscience
March 14, 2020
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/167290
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