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Martin, C., Llobera, A., Villanueva, G., Voigt, A., Gruetzner, G., Brugger, J., & Perez-Murano, F. (2009). Stress and aging minimization in photoplastic AFM probes. Microelectronic Engineering, 86(4-6), 1226–1229. https://doi.org/10.1016/j.mee.2008.12.033

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