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research article

SOI Pixel Based on a Floating Body Partially Depleted MOSFET in a Delta-Sigma Loop

Harik, L.
•
Sallese, Jean-Michel  
•
Kayal, M.  
2009
IEEE Sensors Journal

Standard techniques used for measuring the photocurrent of an SOI phototransistor have failed due to two main reasons: the first being the low signal-to-noise ratio and the second being the slow transient. In this paper, the partially depleted silicon on insulator (SOI) metal-oxide-semiconductor field effect transistor (MOSFET) has been used as a light intensity sensor. Using a novel technique of measurement enables us to embed this phototransistor in the delta-sigma loop. The presented circuits implement a first-order delta-sigma modulator with limited number of transistors maximizing the fill factor. Measured data show that the implemented pixels were sensitive to flux densities as low as 3 mW/m(2) with a resolution of 7.5 bits.

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Type
research article
DOI
10.1109/jsen.2009.2025807
Web of Science ID

WOS:000268020400017

Author(s)
Harik, L.
Sallese, Jean-Michel  
Kayal, M.  
Date Issued

2009

Publisher

Institute of Electrical and Electronics Engineers

Published in
IEEE Sensors Journal
Volume

9

Issue

8

Start page

994

End page

1001

Subjects

Partially depleted

•

phototransistors

•

silicon on insulator (SOI) metal-oxide-semiconductor field effect transistor (MOSFET)

•

transient charge pumping

•

Model

Note

Sensors Conference 2008

2008

Lecce, ITALY

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

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EDLAB  
Available on Infoscience
October 21, 2010
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/55914
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