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  4. A complete digital optics applied to digital holographic microscopy: Application to chromatic aberration compensation
 
conference paper

A complete digital optics applied to digital holographic microscopy: Application to chromatic aberration compensation

Colomb, T.  
•
Charrière, F.  
•
Kühn, J.
Show more
2007
Optical Measurement Systems for Industrial Inspection V
Europe Optical Metrology

In optics, optical elements are used to transform, to filter or to process physical wavefronts in order to magnify images, compensate for aberration or to suppress unwanted diffracted order for example. Because digital holography provides numerical wavefronts, we developed a digital optics, involving numerical elements such as numerical lenses and pinholes, to mimic numerically what is usually done physically, with the advantage to be able to define any shape for these elements and to place them everywhere without obstruction problems. We demonstrate that automatic and non-automatic procedures allow diffracted order or parasitic interferences filtering, compensation for aberration and image distortion, and control of position and magnification of reconstructed wavefront. We apply this digital optics to compensate for chromatic aberration in multi-wavelength holography in order to have perfect superposition between wavefronts reconstructed from digital hologram recorded with different wavelengths. This has a great importance for synthetic wavelength digital holography or tomographic digital holography that use multiple wavelengths.

  • Details
  • Metrics
Type
conference paper
DOI
10.1117/12.726052
Author(s)
Colomb, T.  
Charrière, F.  
Kühn, J.
Montfort, F.  
Depeursinge, C.  
Date Issued

2007

Publisher

SPIE

Published in
Optical Measurement Systems for Industrial Inspection V
ISBN of the book

0819467588

Volume

6616

Subjects

[MVD]

•

Aberration compensation

•

Digital holography

•

Microscopy

URL

URL

http://spie.org/x648.html?product_id=726052
Editorial or Peer reviewed

NON-REVIEWED

Written at

EPFL

EPFL units
LOA  
Event nameEvent placeEvent date
Europe Optical Metrology

Munich

June 17-21, 2007

Available on Infoscience
July 20, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/41631
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