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research article

Strong coupling in high-finesse organic semiconductor microcavities

Connolly, L.G.
•
Lidzey, D.G.
•
Butté, R.  
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2003
Applied Physics Letters

We report the fabrication of high-finesse strongly coupled microcavities composed of a polystyrene film doped with the dye tetraphenyl-porphyrin zinc positioned between two high reflectivity dielectric mirrors. The bottom mirror was deposited by plasma enhanced chemical vapor deposition, and was composed of 11 lambda/4 thick (silicon oxide/silicon nitride) pairs. The organic layer was deposited on to this by spin coating. Finally, the top mirror was deposited by thermal evaporation and consisted of 12 lambda/4 thick (tellurium oxide/lithium fluoride) pairs. Such cavities are characterized by Q factors of between 440 and 620. Strong coupling was evidenced via white light reflectivity measurements. Due to the high cavity Q factor, a Rabi splitting of 135 meV at resonance was very clearly resolved. (C) 2003 American Institute of Physics.

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Type
research article
DOI
10.1063/1.1637146
Author(s)
Connolly, L.G.
Lidzey, D.G.
Butté, R.  
Adawi, A.M.
Whittaker, D.M.
Skolnick, M.S
Airey, R.
Date Issued

2003

Publisher

American Institute of Physics

Published in
Applied Physics Letters
Volume

83

Start page

5377

End page

5379

Subjects

Polariton Emission

•

Excitons

Editorial or Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
LASPE  
Available on Infoscience
November 12, 2010
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/57449
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