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  4. Voltage References for the Ultra-Wide Temperature Range from 4.2 K to 300 K in 40-nm CMOS
 
conference paper

Voltage References for the Ultra-Wide Temperature Range from 4.2 K to 300 K in 40-nm CMOS

van Staveren, J.
•
Almudever, C. Garcia
•
Scappucci, G.
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January 1, 2019
Ieee 45Th European Solid State Circuits Conference (Esscirc 2019)
IEEE 45th European Solid State Circuits Conference (ESSCIRC)

This paper presents a family of voltage references in standard 40-nm CMOS that exploits the temperature dependence of dynamic-threshold MOS, NMOS and PMOS transistors in weak inversion to enable operation over the ultra-wide temperature range from 4.2 K to 300 K. The proposed references achieve a temperature drift below 436 ppm/K over a statistically significant number of samples after a single-point trim and a supply regulation better than 1.7 %/V from a a supply as low as 0.99 V. These results demonstrate, for the first time, the generation of PVT-independent voltages over an ultra-wide temperature range using sub-1-V nanometer CMOS circuits, thus enabling the use of the proposed references in harsh environments, such as in space and quantum-computing applications.

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Type
conference paper
DOI
10.1109/ESSCIRC.2019.8902861
Web of Science ID

WOS:000520410000006

Author(s)
van Staveren, J.
Almudever, C. Garcia
Scappucci, G.
Veldhorst, M.
Babaie, M.
Charbon, E.  
Sebastiano, F.
Date Issued

2019-01-01

Publisher

IEEE

Publisher place

New York

Published in
Ieee 45Th European Solid State Circuits Conference (Esscirc 2019)
ISBN of the book

978-1-7281-1550-4

Series title/Series vol.

Proceedings of the European Solid-State Circuits Conference

Start page

37

End page

40

Subjects

Engineering, Electrical & Electronic

•

Engineering

•

transistors

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
AQUA  
Event nameEvent placeEvent date
IEEE 45th European Solid State Circuits Conference (ESSCIRC)

Cracow, POLAND

Sep 23-26, 2019

Available on Infoscience
April 8, 2020
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/168031
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