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review article

At the frontiers of high-resolution hard-x-ray microscopy: an international programme

Wu, S. R.
•
Lin, C. H.
•
Chen, Y. S.
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2013
Journal of Physics D : Applied Physics

We review the recent progress achieved by our international collaboration on novel imaging techniques based on high-brightness and highly coherent synchrotron sources. After outlining the background, we will discuss the technical progress of recent years. Then, we will exemplify the applications with a number of cases in materials science and life sciences, in particular neurobiology. New results on metal electrodeposition will be used to practically illustrate the impact of the techniques in this important technological area and in general its potential for materials research. Finally, we will briefly comment on the foreseeable technical improvements and on their positive consequences.

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Type
review article
DOI
10.1088/0022-3727/46/49/494005
Author(s)
Wu, S. R.
Lin, C. H.
Chen, Y. S.
Chen, Y. Y.
Hwu, Y.
Chu, Y. S.
Margaritondo, G.  
Date Issued

2013

Published in
Journal of Physics D : Applied Physics
Volume

46

Issue

49

Article Number

494005

Subjects

CIBM-PC

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
CIBM  
LPRX  
Available on Infoscience
November 26, 2013
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/97258
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