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  4. Temperature-dependent low electric field charging of Si nanocrystals embedded within oxide–nitride–oxide dielectric stacks
 
research article

Temperature-dependent low electric field charging of Si nanocrystals embedded within oxide–nitride–oxide dielectric stacks

Nikolaou, N
•
Dimitrakis, P
•
Normand, P
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2009
Nanotechnology
  • Details
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Type
research article
DOI
10.1088/0957-4484/20/30/305704
Author(s)
Nikolaou, N
Dimitrakis, P
Normand, P
Schamm, Sylvie
Bonafos, Caroline
Ben Assayag, Gerard
Mouti, Anas  
Ioannou-Sougleridis, V
Date Issued

2009

Published in
Nanotechnology
Volume

20

Issue

30

Article Number

305704

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
CIME  
Available on Infoscience
November 9, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/44103
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