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  4. Probing the Formation of Nonlinear Optical States with Free Electrons
 
conference paper

Probing the Formation of Nonlinear Optical States with Free Electrons

Henke, Jan Wilke
•
Yang, Yujia  
•
Kappert, F. Jasmin
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2024
2024 Conference on Lasers and Electro-Optics, CLEO 2024
Conference on Lasers and Electro-Optics

Combining nonlinear integrated photonics with electron microscopy, we probe the formation of optical dissipative structures in Si3N4 microresonators with free electrons and find unique spectral fingerprints in the electron spectrum that enable new electron beam modulation schemes.

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Type
conference paper
DOI
10.1364/cleo_fs.2024.fw3p.3
Scopus ID

2-s2.0-85215071336

Author(s)
Henke, Jan Wilke

Max Planck Institute for Multidisciplinary Sciences

Yang, Yujia  

École Polytechnique Fédérale de Lausanne

Kappert, F. Jasmin

Max Planck Institute for Multidisciplinary Sciences

Raja, Arslan S.  

École Polytechnique Fédérale de Lausanne

Arend, Germaine

Max Planck Institute for Multidisciplinary Sciences

Huang, Guanhao  

École Polytechnique Fédérale de Lausanne

Feist, Armin

Max Planck Institute for Multidisciplinary Sciences

Qiu, Zheru  

École Polytechnique Fédérale de Lausanne

Wang, Rui Ning  

École Polytechnique Fédérale de Lausanne

Tusnin, Aleksandr  

École Polytechnique Fédérale de Lausanne

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Date Issued

2024

Publisher

Institute of Electrical and Electronics Engineers Inc.

Published in
2024 Conference on Lasers and Electro-Optics, CLEO 2024
ISBN of the book

9781957171395

Subjects

Electron optics

•

Electrons

•

Free electron lasers

•

Integrated optics

•

Microcavities

•

Nonlinear optics

•

Optical microscopy

•

Optical modulation

•

Photonics

•

Probes

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LPQM1  
MIRAEX
LPQM2  
Event nameEvent acronymEvent placeEvent date
Conference on Lasers and Electro-Optics

Charlotte, United States

2024-05-07 - 2024-05-10

Available on Infoscience
January 26, 2025
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/245173
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