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research article

Growth mode and atomic structure of MnSi thin films on Si(111)

Geisler, B.
•
Kratzer, P.
•
Suzuki, T.
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2012
Physical Review B

Thin films of MnSi(111) in B20 structure formed by reactive epitaxy on Si(111) are studied using scanning tunneling microscopy (STM) and density functional theory calculations. Coexisting root 3 x root 3 structures with high or low corrugation are observed and assigned to different Mn coverage by using a detailed analysis of simulated STM images. Comparison with our interpretation of STM images of films previously grown by codeposition of Mn and Si provides us with evidence that the stacking sequence of Mn and Si lattice planes depends on the growth protocol.

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Type
research article
DOI
10.1103/PhysRevB.86.115428
Web of Science ID

WOS:000308866700005

Author(s)
Geisler, B.
Kratzer, P.
Suzuki, T.
Lutz, T.
Costantini, G.
Kern, K.  
Date Issued

2012

Publisher

Amer Physical Soc

Published in
Physical Review B
Volume

86

Issue

11

Article Number

115428

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LSEN  
Available on Infoscience
February 27, 2013
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/89483
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