research article
Length scaling of the Double Gate Tunnel FET with a high-K gate dielectric
Type
research article
Web of Science ID
WOS:000251831200013
Author(s)
Date Issued
2007
Publisher
Published in
Volume
51
Issue
11-12
Start page
1500
End page
1507
Editorial or Peer reviewed
NON-REVIEWED
Written at
EPFL
EPFL units
Available on Infoscience
November 8, 2010
Use this identifier to reference this record