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  4. Scanning tunneling microscopy observation of a mott-insulator phase at the 1T-TaSe2 surface
 
research article

Scanning tunneling microscopy observation of a mott-insulator phase at the 1T-TaSe2 surface

Ronci, F.
•
Cricenti, A.
•
Perfetti, L.  
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2006
Japanese Journal Of Applied Physics Part 1-Regular Papers Brief Communications & Review Papers

We present scanning tunneling microscopy (STM) measurements at the TaSe2 surface showing a first order process leading to a surface Mott transition. This metal to insulator transition is triggered by the commensurate charge density wave (CDW) which set up at 475 K. The electronic structure rearrangement due to the new periodicity gives rise to a half filled sub-band prone to the localization phenomena. This transition results fully developed below 250K in agreement with previous photoemission Measurements.

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Type
research article
DOI
10.1143/JJAP.45.1950
Web of Science ID

WOS:000236624100016

Author(s)
Ronci, F.
Cricenti, A.
Perfetti, L.  
Berger, H.  
Grioni, M.  
Colonna, S.
Date Issued

2006

Published in
Japanese Journal Of Applied Physics Part 1-Regular Papers Brief Communications & Review Papers
Volume

45

Start page

1950

End page

1952

Subjects

Stm

•

carge density wave

•

TaSe2

•

Mott transition

•

Charge-Density Waves

•

2H-Tase2

•

State

Editorial or Peer reviewed

NON-REVIEWED

Written at

EPFL

EPFL units
LSE  
Available on Infoscience
April 1, 2010
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/49120
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