Repository logo

Infoscience

  • English
  • French
Log In
Logo EPFL, École polytechnique fédérale de Lausanne

Infoscience

  • English
  • French
Log In
  1. Home
  2. Academic and Research Output
  3. Conferences, Workshops, Symposiums, and Seminars
  4. Transmission and Reflection Electron Microscopy on Cleaved Edges of III-V Multilayered Structures
 
conference paper

Transmission and Reflection Electron Microscopy on Cleaved Edges of III-V Multilayered Structures

Buffat, Philippe-André
•
Ganière, Jean-Daniel
•
Stadelmann, Pierre
Cherns, D
1989
NATO ASI Series
Evaluation of Advanced Semiconductor Materials by Electron Microscopy
  • Details
  • Metrics
Type
conference paper
DOI
10.1007/978-1-4613-0527-9_23
Author(s)
Buffat, Philippe-André
Ganière, Jean-Daniel
Stadelmann, Pierre
Editors
Cherns, D
Date Issued

1989

Publisher

NATO

Published in
NATO ASI Series
ISBN of the book

0-306-43362-1

Volume

203

Start page

319

End page

334

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
CIME  
Event nameEvent placeEvent date
Evaluation of Advanced Semiconductor Materials by Electron Microscopy

Wills Hall, Bristol, UK

11-17 September 1988

Available on Infoscience
July 4, 2019
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/158833
Logo EPFL, École polytechnique fédérale de Lausanne
  • Contact
  • infoscience@epfl.ch

  • Follow us on Facebook
  • Follow us on Instagram
  • Follow us on LinkedIn
  • Follow us on X
  • Follow us on Youtube
AccessibilityLegal noticePrivacy policyCookie settingsEnd User AgreementGet helpFeedback

Infoscience is a service managed and provided by the Library and IT Services of EPFL. © EPFL, tous droits réservés