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research article

Coherence-based edge diffraction sharpening of x-ray images: A simple model

Margaritondo, G.  
•
Tromba, G.
1999
Journal of Applied Physics

Recent, striking examples of x-ray image sharpening are based on Fresnel edge diffraction. A simple model shows that image sharpening can be achieved under less stringent conditions as could be thought. The extreme spatial coherence of third-generation synchrotron sources appears helpful but not strictly necessary, and high time coherence is not an essential requirement. These conclusions, consistent with the results of other authors, strongly enhance the potential impact in medical x-ray applications, materials science and other fields. (C) 1999 American Institute of Physics. [S0021-8979(99)01107-X].

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Type
research article
DOI
10.1063/1.369697
Web of Science ID

WOS:000079403900003

Author(s)
Margaritondo, G.  
Tromba, G.
Date Issued

1999

Published in
Journal of Applied Physics
Volume

85

Issue

7

Start page

3406

End page

3408

Subjects

CONTRAST

Note

Sincrotrone Trieste SCpA, I-34012 Trieste, Italy. Ecole Polytech Fed Lausanne, Inst Phys Appl, CH-1015 Lausanne, Switzerland. Margaritondo, G, Sincrotrone Trieste SCpA, Padriciano 99, I-34012 Trieste, Italy.

ISI Document Delivery No.: 180UQ

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LSE  
LPRX  
Available on Infoscience
October 3, 2006
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/234811
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