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research article

Analytical description of STED microscopy performance

Leutenegger, Marcel  
•
Eggeling, Christian
•
Hell, Stefan W.
2010
Optics Express

Stimulated emission depletion (STED) resolves fluorescent features that are closer than the far-field optical diffraction limit by applying a spatially modulated light field keeping all but one of these features dark consecutively. For estimating the efficiency of transient fluorophore darkening, we developed analytical equations considering the spatio-temporal intensity profile of the STED beam. These equations provide a quick analysis and optimization of the resolution and contrast to be gained under various conditions, such as continuous wave or pulsed STED beams having different pulse durations. Particular emphasis is placed on fluorescence fluctuation methods such as correlation spectroscopy (FCS) using STED.

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Type
research article
DOI
10.1364/OE.18.026417
Author(s)
Leutenegger, Marcel  
Eggeling, Christian
Hell, Stefan W.
Date Issued

2010

Publisher

Optical Society of America

Published in
Optics Express
Volume

18

Issue

25

Article Number

26417

Subjects

(050.1940 Diffraction

•

(180.2520) Fluorescence microscopy

•

(260.2510) Fluorescence

Editorial or Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
LOB  
Available on Infoscience
December 5, 2010
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/61908
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