Repository logo

Infoscience

  • English
  • French
Log In
Logo EPFL, École polytechnique fédérale de Lausanne

Infoscience

  • English
  • French
Log In
  1. Home
  2. Academic and Research Output
  3. Journal articles
  4. In situ core level and valence band photoelectron spectroscopy of reactively sputtered titanium aluminum nitride films
 
research article

In situ core level and valence band photoelectron spectroscopy of reactively sputtered titanium aluminum nitride films

Schueler, Andreas  
•
Oelhafen, Peter
•
Francz, G.
Show more
2001
Physical Review B
  • Details
  • Metrics
Type
research article
DOI
10.1103/PhysRevB.63.115413
Author(s)
Schueler, Andreas  
Oelhafen, Peter
Francz, G.
Zehnder, T.
Düggelin, M.
Mathys, D.
Guggenheim, R.
Date Issued

2001

Published in
Physical Review B
Volume

63

Issue

11

Start page

115413/1

End page

8

Editorial or Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
LESO-PB  
Available on Infoscience
May 4, 2012
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/80068
Logo EPFL, École polytechnique fédérale de Lausanne
  • Contact
  • infoscience@epfl.ch

  • Follow us on Facebook
  • Follow us on Instagram
  • Follow us on LinkedIn
  • Follow us on X
  • Follow us on Youtube
AccessibilityLegal noticePrivacy policyCookie settingsEnd User AgreementGet helpFeedback

Infoscience is a service managed and provided by the Library and IT Services of EPFL. © EPFL, tous droits réservés