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  4. Electron diffraction and infrared study of the semimetallic layered compound Ti1−xVxSe2
 
research article

Electron diffraction and infrared study of the semimetallic layered compound Ti1−xVxSe2

Vaterlaus, H.P.
•
Ansermet, S.
•
Py, M.
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1980
Solid State Communications

The crystals of the system Ti1−xVxSe2 (C ≤ x ≤ 0.05) undergo a second order structural phase transition. Electron diffraction studies show that the transition temperature decreases with progressive V-doping. The phase transition considerably affects the infrared reflectivity, measured at 300 and 77 K in the spectral range 40 cm−1 to 4000 cm−1. The presence of free carriers and the existence of optical infrared active Eu phonon modes Full-size image (<1 K) confer their characteristic appearance to the spectra. At room temperature one phonon structure is measured at 143 cm−1. At 77 K a new series of phonon peaks appears up to a V-concentration of 5 % as a direct consequence of superlattice formation. At room temperature the plasma-edge shifts towards higher frequencies as the vanadium concentration increases. This effect is caused by a large increase of Full-size image (<1 K), associated with the mixing of impurities. It is indicative of the small density of states at the Fermi level in semimetallic TiSe2. Our results suggest a phase transition driven by lattice dynamical effects.

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Type
research article
DOI
10.1016/0038-1098(80)90990-4
Author(s)
Vaterlaus, H.P.
Ansermet, S.
Py, M.
Lévy, F.
Date Issued

1980

Publisher

Elsevier

Published in
Solid State Communications
Volume

35

Issue

12

Start page

925

End page

929

Subjects

Ti1-xVxSe2

•

electron diffraction

•

infrared reflectivity

•

superlattice formation

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LOEQ  
Available on Infoscience
August 28, 2015
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/117440
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