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research article

Positive exchange bias in thin film multilayers produced with nano-oxide layer

Chun, Byong Sun
•
Nahm, Ho-Hyun
•
Abid, Mohamed
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2013
Applied Physics Letters

We report a positive exchange bias in thin film multilayers produced with nano-oxide layer. The positive exchange bias resulted from an antiferromagnetic interfacial exchange coupling between the ferromagnetic CoFe and the antiferromagnetic CoO layers, which spontaneously forms on top of the nano-oxide layer during the subsequent deposition of a CoFe layer. The shift in the hysteresis loop along the direction of the cooling field and the change in the sign of exchange bias are evidence of antiferromagnetic interfacial exchange coupling. The high temperature positive exchange bias observed for our system results from magnetic proximity effects between CoFe and CoO.

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Type
research article
DOI
10.1063/1.4812748
Web of Science ID

WOS:000321145200057

Author(s)
Chun, Byong Sun
Nahm, Ho-Hyun
Abid, Mohamed
Wu, Han-Chun
Kim, Yong-Sung
Chu, In Chang
Hwang, Chanyong
Date Issued

2013

Publisher

Amer Inst Physics

Published in
Applied Physics Letters
Volume

102

Issue

25

Article Number

252406

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
ICMP  
Available on Infoscience
October 1, 2013
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/95197
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