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  4. Characterization of Microfabricated Probes for Combined Atomic Force and High-Resolution Scanning Electrochemical Microscopy
 
research article

Characterization of Microfabricated Probes for Combined Atomic Force and High-Resolution Scanning Electrochemical Microscopy

Gullo, M.
•
Frederix, P.
•
Akiyama, T.  
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2006
Analytical Chemistry

A combined atomic force and scanning electrochemical microscope probe is presented. The probe is electrically insulated except at the very apex of the tip, which has a radius of curvature in the range of 10-15 nm. Steady-state cyclic voltammetry measurements for the reduction of Ru(NH3) 6Cl3 and feedback experiments showed a distinct and reproducible response of the electrode. These experimental results agreed with finite element simulations for the corresponding diffusion process. Sequentially topographical and electrochemical studies of Pt lines deposited onto Si 3N4 and spaced 100 nm apart (edge to edge) showed a lateral electrochemical resolution of 10 nm. © 2006 American Chemical Society.

  • Details
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Type
research article
DOI
10.1021/ac0521495
Author(s)
Gullo, M.
Frederix, P.
Akiyama, T.  
Engel, A.
de Rooij, N. F.  
Staufer, U.
Frederix, P.L.T.M.
Date Issued

2006

Published in
Analytical Chemistry
Volume

78

Issue

15

Start page

5436

End page

5444

Note

372

Editorial or Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
SAMLAB  
Available on Infoscience
May 12, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/39368
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