conference paper
Three-Dimensional Localization of Nano-Emitters with Nanometer-Level Precision
2009
Novel Techniques in Microscopy
We show nanometer-level localization accuracy of a single quantum-dot in three dimensions by self-interference and diffraction-pattern analysis. We believe that this approach has the capacity to push optical microscopy to the molecular level.
Type
conference paper
Author(s)
Date Issued
2009
Published in
Novel Techniques in Microscopy
Subjects
Editorial or Peer reviewed
NON-REVIEWED
Written at
EPFL
EPFL units
| Event name | Event place | Event date |
Vancouver, CA | April 30, 2009 | |
Available on Infoscience
May 27, 2010
Use this identifier to reference this record