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  4. Determination of the midgap density of states and capture cross-sections in polymorphous silicon by space-charge-limited conductivity and relaxation
 
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research article

Determination of the midgap density of states and capture cross-sections in polymorphous silicon by space-charge-limited conductivity and relaxation

Meaudre, R.
•
Meaudre, M.
•
Butte, R.  
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1999
Philosophical Magazine Letters

A new type of material consisting of an amorphous silicon matrix, in which silicon nanoparticules are embedded, has recently been obtained. This material, named polymorphous silicon (pm-Si), exhibits enhanced transport and stability properties with respect to hydrogenated amorphous silicon (a-Si:H). In order to progress in the understanding of such improved properties, we combine space-charge-limited current and space-charge relaxation measurements which allow us to show that the density of states at the Fermi level and their capture cross sections in pm-Si are at least ten times and five times lower respectively than in a-Si:H. This is in good agreement with photoconductivity results.

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Type
research article
DOI
10.1080/095008399176832
Author(s)
Meaudre, R.
•
Meaudre, M.
•
Butte, R.  
•
Vignoli, S.
Date Issued

1999

Published in
Philosophical Magazine Letters
Volume

79

Issue

9

Start page

763

End page

769

Subjects

HYDROGENATED AMORPHOUS-SILICON

•

A-SI-H

•

METASTABLE DEFECTS

Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
LASPE  
Available on Infoscience
October 5, 2010
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/54894
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