Repository logo

Infoscience

  • English
  • French
Log In
Logo EPFL, École polytechnique fédérale de Lausanne

Infoscience

  • English
  • French
Log In
  1. Home
  2. Academic and Research Output
  3. Journal articles
  4. A driven tagged particle in asymmetric exclusion processes
 
research article

A driven tagged particle in asymmetric exclusion processes

Wang, Zhe  
January 1, 2022
Electronic Journal Of Probability

We consider the asymmetric exclusion process with a driven tagged particle on Z which has different jump rates from other particles. When the non-tagged particles have non-nearest-neighbor jump rates , we show that the tagged particle can have a speed which has a different sign from the mean derived from its jump rates. We also show the existence of some non-trivial invariant measures for the environment process viewed from the tagged particle. Our arguments are based on coupling, martingale methods, and analyzing currents through fixed bonds.

  • Files
  • Details
  • Metrics
Type
research article
DOI
10.1214/22-EJP760
Web of Science ID

WOS:000779508900001

Author(s)
Wang, Zhe  
Date Issued

2022-01-01

Publisher

INST MATHEMATICAL STATISTICS-IMS

Published in
Electronic Journal Of Probability
Volume

27

Subjects

Statistics & Probability

•

Mathematics

•

tagged particles

•

interacting particle system

•

invariant measures

•

central-limit-theorem

•

einstein relation

•

blocking measures

•

ergodic theorems

•

hydrodynamics

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
PRST  
Available on Infoscience
April 25, 2022
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/187261
Logo EPFL, École polytechnique fédérale de Lausanne
  • Contact
  • infoscience@epfl.ch

  • Follow us on Facebook
  • Follow us on Instagram
  • Follow us on LinkedIn
  • Follow us on X
  • Follow us on Youtube
AccessibilityLegal noticePrivacy policyCookie settingsEnd User AgreementGet helpFeedback

Infoscience is a service managed and provided by the Library and IT Services of EPFL. © EPFL, tous droits réservés