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  4. Characterization of lattice-matched single In1-xGaxAsyP1-y quantum wells grown by conventional liquid phase epitaxy
 
research article

Characterization of lattice-matched single In1-xGaxAsyP1-y quantum wells grown by conventional liquid phase epitaxy

Behcer, S.
•
Gottschalch, V.
•
Wagner, G.
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1994
Semiconductor Science and Technology

In this letter the liquid phase epitaxial growth of In0.71Ga0.29As0.68P0.32 (lambda(g) = 1.32 mum) single quantum well structures lattice matched to (001) InP substrates is reported. The electrical and optical confinement was formed either by InP or In0.88Ga0.12As0.26 p0.74 (lambda(g) = 1.05 mum). Low-temperature photoluminescence was employed to prove the samples capable of displaying quantum size effects. Energy upshifts up to 125 meV were measured for InP-clad quantum wells of about 50 angstrom thickness. All multilayered stacks originate from step-cooling growth cycles in an ordinary linear slider boat. Streamlining of the experimental conditions has led to a conspicuous decrease in the FWHM values of the blueshift signals.

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Type
research article
DOI
10.1088/0268-1242/9/8/020
Web of Science ID

WOS:A1994PA82700020

Author(s)
Behcer, S.
Gottschalch, V.
Wagner, G.
Schwabe, R.
Staehli, J. L.  
Date Issued

1994

Published in
Semiconductor Science and Technology
Volume

9

Issue

8

Start page

1558

End page

1563

Subjects

INP

•

INGAASP

•

LPE

•

GAXIN1-XASYP1-Y

Note

Univ leipzig,fac phys,d-04103 leipzig,germany. swiss fed inst technol,ph ecublens,inst appl phys,ch-1015 lausanne,switzerland. Behcer, s, univ leipzig,fac chem & mineral,linnestr 3,d-04103 leipzig,germany.

ISI Document Delivery No.: PA827

Cited Reference Count: 17

Cited References:

BANTIEN F, 1987, J CRYST GROWTH, V85, P194

BECHER S, 1994, IN PRESS CRYST RES T

CAPELLA RM, 1985, I PHYS C SER, V74

DUTTA NK, 1980, J APPL PHYS, V51, P6095

GOTTSCHALCH V, 1990, CRYST RES TECHNOL, V25, P637

KUPHAL E, 1991, APPL PHYS A-SOLID, V52, P380

KUWANO N, 1988, JPN J APPL PHYS, V27, P1768

MORLOCK U, 1991, PHYS REV B, V44, P8792

NICHOLAS RJ, 1980, APPL PHYS LETT, V37, P178

OHISHI T, 1990, I PHYS C SER, V112

OMNES F, 1991, APPL PHYS LETT, V59, P1034

PANISH MB, 1986, APPL PHYS LETT, V49, P164

REZEK EA, 1978, J APPL PHYS, V49

SASAI Y, 1985, JPN J APPL PHYS PT 2, V24, L137

SCHANEN CF, 1990, IEE P, V137

THIJS PJA, 1986, J CRYST GROWTH, V74, P625

THIJS PJA, 1988, J CRYST GROWTH, V93, P863

Editorial or Peer reviewed

REVIEWED

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Available on Infoscience
August 31, 2007
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/11107
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