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Low-temperature thin-film indium bonding for reliable wafer-level hermetic MEMS packaging
research article
This paper reports on low-temperature and hermetic thin-film indium bonding for wafer-level encapsulation and packaging of delicate and temperature sensitive devices. This indium-bonding technology enables bonding of surface materials commonly used in MEMS technology. The temperature is kept below 140 degrees C for all process steps and no surface treatment is applied before and during bonding. This bonding technology allows hermetic sealing at 140 degrees C with a leak rate below 4 x 10(-12) mbar l s(-1) at room temperature. The tensile strength of the bonds up to 25 MPa goes along with a very high yield.
Type
research article
Web of Science ID
WOS:000321063300016
Author(s)
Date Issued
2013
Publisher
Published in
Volume
23
Issue
7
Article Number
075007
Peer reviewed
REVIEWED
Written at
EPFL
EPFL units
Available on Infoscience
October 1, 2013
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