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research article
Atomic Force Microscopy Using Cantilevers with Integrated Tips and Piezoelectric Layers for Actuation and Detection
Type
research article
Author(s)
Date Issued
1997
Published in
Issue
7
Start page
218
End page
220
Note
158
Peer reviewed
REVIEWED
Written at
OTHER
EPFL units
Available on Infoscience
May 12, 2009
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