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  4. Semi-Analytical Techniques for Substrate Characterization in the Design of Mixed-Signal ICs
 
conference paper

Semi-Analytical Techniques for Substrate Characterization in the Design of Mixed-Signal ICs

Charbon, E.  
•
Gharpurey, R.
•
Meyer, R. G.
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1996
Proceedings of the International Conference on Computer Aided Design
IEEE International Conference on Computer Aided Design
  • Details
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Type
conference paper
DOI
10.1109/ICCAD.1996.569838
Author(s)
Charbon, E.  
Gharpurey, R.
Meyer, R. G.
Sangiovanni-Vincentelli, A.
Date Issued

1996

Published in
Proceedings of the International Conference on Computer Aided Design
Start page

455

End page

462

Editorial or Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
AQUA  
Event nameEvent placeEvent date
IEEE International Conference on Computer Aided Design

San Jose, CA

November

Available on Infoscience
June 26, 2006
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/232126
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