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  4. Short basis functions for constant-variance interpolation
 
conference paper

Short basis functions for constant-variance interpolation

Thevenaz, Philippe
•
Blu, Thierry  
•
Unser, Michael  
2008
Medical Imaging 2008: Image Processing, Pts 1-3
Medical Imaging 2008 Conference

An interpolation model is a necessary ingredient of intensity-based registration methods. The properties of such a model depend entirely on its basis function, which has been traditionally characterized by features such as its order of approximation and its support. However, as has been recently shown, these features are blind to the amount of registration bias created by the interpolation process alone; an additional requirement that has been named constant-variance interpolation is needed to remove this bias. In this paper, we present a theoretical investigation of the role of the interpolation basis in a registration context. Contrarily to published analyses, ours is deterministic; it nevertheless leads to the same conclusion, which is that constant-variance interpolation is beneficial to image registration. In addition, we propose a novel family of interpolation bases that can have any desired order of approximation while maintaining the constant-variance property. Our family includes every constant-variance basis we know of. It is described by an explicit formula that contains two free functional terms: an arbitrary 1-periodic binary function that takes values from {-1, 1}, and another arbitrary function that must satisfy the partition of unity. These degrees of freedom can be harnessed to build many family members for a given order of approximation and a fixed support. We provide the example of a symmetric basis with two orders of approximation that is supported over [-3 ⁄ 2, 3 ⁄ 2]; this support is one unit shorter than a basis of identical order that had been previously published.

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Type
conference paper
DOI
10.1117/12.770234
Web of Science ID

WOS:000256058600090

Author(s)
Thevenaz, Philippe
•
Blu, Thierry  
•
Unser, Michael  
Date Issued

2008

Publisher

Spie-Int Soc Optical Engineering, Po Box 10, Bellingham, Wa 98227-0010 Usa

Published in
Medical Imaging 2008: Image Processing, Pts 1-3
Series title/Series vol.

Proceedings Of The Society Of Photo-Optical Instrumentation Engineers (Spie); 6914

Start page

L9142

End page

L9142

Subjects

multiresolution and wavelets

•

registration

•

Image Registration

•

Mutual Information

URL

URL

http://bigwww.epfl.ch/publications/thevenaz0803.html

URL

http://bigwww.epfl.ch/publications/thevenaz0803.pdf

URL

http://bigwww.epfl.ch/publications/thevenaz0803.ps
Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LIB  
Event nameEvent placeEvent date
Medical Imaging 2008 Conference

San Diego, CA

Feb 17-19, 2008

Available on Infoscience
November 30, 2010
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/61375
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