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  4. SURE-Based Wavelet Thresholding Integrating Inter-Scale Dependencies
 
conference paper

SURE-Based Wavelet Thresholding Integrating Inter-Scale Dependencies

Luisier, F.  
•
Blu, T.  
•
Unser, M.  
2006
Proceedings of the 2006 IEEE International Conference on Image Processing (ICIP'06)

We propose here a new pointwise wavelet thresholding function that incorporates inter-scale dependencies. This non-linear function depends on a set of four linear parameters per subband which are set by minimizing Stein's unbiased MSE estimate (SURE). Our approach assumes additive Gaussian white noise. In order for the inter-scale dependencies to be faithfully taken into account, we also develop a rigorous feature alignment processing, that is adapted to arbitrary wavelet filters (e.g. non-symmetric filters). Finally, we demonstrate the efficiency of our denoising approach in simulations over a wide range of noise levels for a representative set of standard images.

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Type
conference paper
DOI
10.1109/ICIP.2006.312705
Author(s)
Luisier, F.  
Blu, T.  
Unser, M.  
Date Issued

2006

Publisher

IEEE

Published in
Proceedings of the 2006 IEEE International Conference on Image Processing (ICIP'06)
Issue

Atlanta GA, USA

Start page

1457

End page

1460

URL

URL

http://bigwww.epfl.ch/publications/luisier0601.html

URL

http://bigwww.epfl.ch/publications/luisier0601.pdf

URL

http://bigwww.epfl.ch/publications/luisier0601.ps
Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LIB  
Available on Infoscience
September 18, 2015
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/118128
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