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  4. Influence of abrasive concentration on the qualiy of wire-sawn silicon wafers
 
conference paper

Influence of abrasive concentration on the qualiy of wire-sawn silicon wafers

Bidiville, A
•
Wasmer, K
•
Michler, J
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2008
Proceedings of the 23rd EU PV-SEC
23rd European Photovoltaic Solar Energy Conference

The sawing parameters have an impact on the depth of the defects in the wafers, and hence on their mechanical strength. However, as sawing is a highly complex system, the wafering industry is still relying on a “trial and error” approach to improve the sawing parameters. In this contribution, the effects of the abrasive concentration are studied with the help of the “rolling-indenting model”, the model most commonly used to describe the sawing process. From roughness and cracks depth measurement correlated with flexure tests, we show that using a lower silicon carbide concentration in the slurry decreases the depth of the defects as well as the roughness and results in a higher breakage strength of the wafers.

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